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Proceedings Paper

Ultrahigh-resolution photographic films for x-ray/EUV/FUV astronomy
Author(s): Richard B. Hoover; Arthur B. C. Walker; Craig Edward DeForest; Richard N. Watts; Charles Tarrio
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Paper Abstract

The quest for ultrahigh resolution full-disk images of the sun at soft X-ray/EUV/FUV wavelengths has increased the demand for photographic films with broad spectral sensitivity, high spatial resolution, and wide dynamic range. These requirements were made more stringent by the recent development of multilayer telescopes and coronagraphs capable of operating at normal incidence at soft X-ray/EUV wavelengths. Photographic films are the only detectors now available with the information storage capacity and dynamic range such as is required for recording images of the solar disk and corona simultaneously with sub arc second spatial resolution. During the Stanford/MSFC/LLNL Rocket X-Ray Spectroheliograph and Multi-Spectral Solar Telescope Array (MSSTA) programs, we utilized photographic films to obtain high resolution full-disk images of the sun at selected soft X-ray/EUV/FUV wavelengths. In order to calibrate our instrumentation for quantitative analysis of our solar data and to select the best emulsions and processing conditions for the MSSTA reflight, we recently tested several photographic films. These studies were carried out at the NIST SURF II synchrotron and the Stanford Synchrotron Radiation Laboratory. In this paper, we provide the results of those investigations.

Paper Details

Date Published: 21 January 1993
PDF: 13 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140587
Show Author Affiliations
Richard B. Hoover, NASA Marshall Space Flight Ctr. (United States)
Arthur B. C. Walker, Stanford Univ. (United States)
Craig Edward DeForest, Stanford Univ. (United States)
Richard N. Watts, National Institute of Standards and Technology (United States)
Charles Tarrio, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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