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Proceedings Paper

Intensity distribution of the x-ray source for the AXAF VETA-I mirror test
Author(s): Ping Zhao; Edwin M. Kellogg; Daniel A. Schwartz; Y. Shao; Melinda Ann Fulton
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Paper Abstract

Intensity distribution measurements of the X-ray source for the AXAF VETA-I mirror test are reported. During the VETA-I test, microscope pictures were taken for each used anode immediately after it was brought out of the source chamber. The source sizes and the intensity distribution structures are shown. They are compared and shown to agree with the results from pinhole camera measurements. It is demonstrated that under operating conditions characteristic of the VETA-I test, all the source sizes have an FWHM of less than 0.45 mm. For a source of this size at 528 m away, the angular size to VETA is less than 0.17 arcsec, which is small compared to the on-ground VETA angular resolution. These results were crucial for VETA data analysis and for obtaining the on-ground and predicted in-orbit VETA point response function.

Paper Details

Date Published: 21 January 1993
PDF: 14 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140579
Show Author Affiliations
Ping Zhao, Smithsonian Astrophysical Observatory (United States)
Edwin M. Kellogg, Smithsonian Astrophysical Observatory (United States)
Daniel A. Schwartz, Smithsonian Astrophysical Observatory (United States)
Y. Shao, Smithsonian Astrophysical Observatory (United States)
Melinda Ann Fulton, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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