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Proceedings Paper

Design and fabrication of the all-reflecting H-Lyman alpha coronagraph/polarimeter
Author(s): Richard B. Hoover; R. Barry Johnson; Silvano Fineschi; Arthur B. C. Walker; Phillip C. Baker; Muamer Zukic; Jongmin Kim
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Paper Abstract

We have designed, analyzed, and are now fabricating an All-Reflecting H-Lyman-alpha Coronagraph/Polarimeter for solar research. This new instrument operates in a narrow bandpass centered at 215.7 A - the neutral hydrogen Ly-alpha line. It is shorter and faster than the telescope which produced solar Ly-alpha images as a part of the MSSTA payload that was launched on May 13, 1991. The Ly-alpha line is produced and linearly polarized in the solar corona by resonance scattering, and the presence of a magnetic field modifies this polarization according to the Hanle effect. The Lyman-alpha Coronagraph/Polarimeter instrument has been designed to measure coronal magnetic fields by interpreting, via the Hanle effect, the measured linear polarization of the coronal Ly-alpha line. Ultrasmooth mirrors, polarizers, and filters are being flow-polished for this instrument from CVD silicon carbide substrates. These optical components will be coated using advanced induced transmission and absorption thin film multilayer coatings to optimize the reflectivity and polarization properties at 1215.7 A. We describe some of the solar imaging results obtained with the MSSTA Lyman-alpha coronagraph. We also discuss the optical design parameters and fabrication plans for the All-Reflecting H-Lyman-alpha Coronagraph/Polarimeter.

Paper Details

Date Published: 21 January 1993
PDF: 14 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140577
Show Author Affiliations
Richard B. Hoover, NASA Marshall Space Flight Ctr. (United States)
R. Barry Johnson, Optical E.T.C., Inc. (United States)
Silvano Fineschi, Smithsonian Astrophysical Observatory (Italy)
Arthur B. C. Walker, Stanford Univ. (United States)
Phillip C. Baker, Baker Consulting (United States)
Muamer Zukic, Univ. of Alabama in Huntsville (United States)
Jongmin Kim, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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