Share Email Print
cover

Proceedings Paper

High-energy x-ray reflectivity and scattering study from spectrum-x-gamma flight mirrors
Author(s): Finn Erland Christensen; Carl Budtz-Joergensen; Peter K. Frederiksen; Niels J. Westergaard; Herbert W. Schnopper
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Line radiation from Fe K-alpha(1), Cu K-alpha(1), and Ag K-alpha(1) is used to study the high energy X-ray reflectivity and scattering behavior of flight-quality X-ray mirrors having various Al substrates. When both the specular and the scattered radiation are integrated, near theoretical reflectivities are found for all mirrors. Results of scattering studies show that scattering is strongly correlated with the Al foil type. Mirrors based on new 0.4 mm Al foil are found to have a typical scattering FWHM of about 1.1 arcmin, whereas mirrors based on 0.3 mm Al foil have an FWHM of greater than 1.5 arcmin. For all mirrors and for all energies, the scattering is found to exhibit the characteristic asymmetries predicted by a first order vector scattering theory.

Paper Details

Date Published: 21 January 1993
PDF: 11 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140555
Show Author Affiliations
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Carl Budtz-Joergensen, Danish Space Research Institute (Denmark)
Peter K. Frederiksen, Danish Space Research Institute (Denmark)
Niels J. Westergaard, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

© SPIE. Terms of Use
Back to Top