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Proceedings Paper

X-ray reflectivity of the AXAF Veta-I optics
Author(s): Edwin M. Kellogg; George Chartas; Dale E. Graessle; John P. Hughes; Leon P. Van Speybroeck; Ping Zhao; Martin C. Weisskopf; Ronald F. Elsner; Stephen L. O'Dell
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Paper Abstract

The study measures the X-ray reflectivity of the AXAF VETA-I optic and compares it with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. A synchrotron reflectivity measurement with a high-energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample is also reported. Evidence is found for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror, perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 and 10 percent. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff.

Paper Details

Date Published: 21 January 1993
PDF: 8 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140552
Show Author Affiliations
Edwin M. Kellogg, Smithsonian Astrophysical Observatory (United States)
George Chartas, Smithsonian Astrophysical Observatory (United States)
Dale E. Graessle, Smithsonian Astrophysical Observatory (United States)
John P. Hughes, Smithsonian Astrophysical Observatory (United States)
Leon P. Van Speybroeck, Smithsonian Astrophysical Observatory (United States)
Ping Zhao, Smithsonian Astrophysical Observatory (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)
Ronald F. Elsner, NASA Marshall Space Flight Ctr. (United States)
Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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