Share Email Print

Proceedings Paper

Evidence for dust contamination on the VETA-I mirror surface
Author(s): Jeffery J. Kolodziejczak; Stephen L. O'Dell; Ronald F. Elsner; Martin C. Weisskopf
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Relative surface brightness data from the VETA-1 test displayed an energy dependence which was inconsistent with models which assume surface roughness is the only cause of scattering. A means of separating an in-plane component of scattering caused by surface roughness from an azimuthally symmetric component, which is expected from dust, was afforded by images taken while only single quarters of the mirror surface were exposed. In this case, in-plane scattered X-rays should populate only opposing 90 deg azimuthal quadrants of an image centered on the focal point. As such, this approach is a novel, high sensitivity test for detecting extremely small (about 10 exp -5) fractional dust coverage on X-ray optics. Comparison of in-plane and out-of-plane quadrants in these tests indicated that most of the scattered data were azimuthally symmetric, and that the symmetric component was enhanced at lower energies. Both results support a model which invokes the wing scan results with a combination of dust and surface roughness induced scattering. The extent to which parameters such as the mirror surface roughness, dust size distribution, spatial distribution, and density may be determined using this approach is also discussed.

Paper Details

Date Published: 21 January 1993
PDF: 9 pages
Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993); doi: 10.1117/12.140550
Show Author Affiliations
Jeffery J. Kolodziejczak, NASA Marshall Space Flight Ctr. (United States)
Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States)
Ronald F. Elsner, NASA Marshall Space Flight Ctr. (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 1742:
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

© SPIE. Terms of Use
Back to Top