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Proceedings Paper

Stability tests for soft x-ray multilayers under exposure to multipole-wiggler radiation
Author(s): Mihiro Yanagihara; Kou Mayama; Seiji Asaoka; Hideki Maezawa
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Paper Abstract

The effect of white wiggler radiation exposure on Mo/BN, W/BN, Mo/B4C, and W/B4C multilayers was evaluated by comparing soft x-ray reflectance at an incidence angle of 45 degree(s). All samples were prepared by magnetron sputtering onto SiC substrates. The choice of combinations was based upon annealing tests for Mo/X and W/X (X equals C, Si, BN, and B4C) multilayers, prior to any exposure tests. The Mo/BN multilayer was found to be the most stable for an exposure time of 10 min under radiation power density of approximately 2.3 W/mm2. The observed reduced reflectance for the Mo/BN and W/BN samples was found to be reducible to a radiation-induced effect on the BN layers.

Paper Details

Date Published: 25 February 1993
PDF: 7 pages
Proc. SPIE 1739, High Heat Flux Engineering, (25 February 1993); doi: 10.1117/12.140517
Show Author Affiliations
Mihiro Yanagihara, Tohoku Univ. (Japan)
Kou Mayama, Tohoku Univ. (Japan)
Seiji Asaoka, National Lab. for High Energy Physics (Japan)
Hideki Maezawa, National Lab. for High Energy Physics (Japan)


Published in SPIE Proceedings Vol. 1739:
High Heat Flux Engineering
Ali M. Khounsary, Editor(s)

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