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Proceedings Paper

Detection of surface microstructure changes by electronic speckle pattern interferometry
Author(s): Gerd Guelker; Klaus D. Hinsch; Claudia Hoelscher
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Paper Abstract

An extension of a common electronic speckle pattern interferometry system is presented, which in addition to deformation measurements enables the spatially resolved quantitative determination of image decorrelation. In the absence of other decorrelation effects this quantity is directly related to surface microstructure changes of test specimen. Without principal variations of a typical ESPI setup a speckle correlation formalism is implemented based on the phase-shift method. Feasibility and restrictions are illustrated in measurements of water-induced changes of natural stone surfaces.

Paper Details

Date Published: 2 March 1993
PDF: 10 pages
Proc. SPIE 1732, Holographics International '92, (2 March 1993); doi: 10.1117/12.140435
Show Author Affiliations
Gerd Guelker, Univ. Oldenburg (Germany)
Klaus D. Hinsch, Univ. Oldenburg (Germany)
Claudia Hoelscher, Univ. Oldenburg (Germany)


Published in SPIE Proceedings Vol. 1732:
Holographics International '92

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