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Proceedings Paper

Grating strain method for measuring strain field in the vicinity of a crack tip
Author(s): Xingjian Wu; Jiabi Chen
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Paper Abstract

For the purpose of measuring strain field in the vicinity of a crack tip accurately, a novel grating strain method based on the diffraction analysis is presented in this paper and an electro-photo detection system is developed. The experimental results show this method is reasonable and practical.

Paper Details

Date Published: 24 April 1992
PDF: 5 pages
Proc. SPIE 1731, Soviet-Chinese Joint Seminar on Holography and Optical Information Processing, (24 April 1992); doi: 10.1117/12.140367
Show Author Affiliations
Xingjian Wu, Huazhong Univ. of Science and Technology (China)
Jiabi Chen, Nanjing Normal Univ. (China)


Published in SPIE Proceedings Vol. 1731:
Soviet-Chinese Joint Seminar on Holography and Optical Information Processing

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