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Proceedings Paper

Chemical monitors based on surface-enhanced raman scattering
Author(s): Tuan Vo-Dinh; Jean Pierre Alarie; W. S. Sutherland; David L. Stokes; Gordon H. Miller
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Paper Abstract

This paper presents an overview of the development of chemical monitors using the surface- enhanced raman scattering (SERS) technique. The SERS effect is based on recent experimental observations, which have indicated enhancement of the Raman scattering efficiency by factors up to 108 when a compound is adsorbed on rough metallic surfaces having submicron protrusions. The focus of our research efforts is on the development of SERS-active sensors and instrumentation capable of field analysis and remote sensing.

Paper Details

Date Published: 9 March 1993
PDF: 8 pages
Proc. SPIE 1716, International Conference on Monitoring of Toxic Chemicals and Biomarkers, (9 March 1993); doi: 10.1117/12.140271
Show Author Affiliations
Tuan Vo-Dinh, Oak Ridge National Lab. (United States)
Jean Pierre Alarie, Oak Ridge National Lab. (United States)
W. S. Sutherland, Oak Ridge National Lab. (United States)
David L. Stokes, Oak Ridge National Lab. (United States)
Gordon H. Miller, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 1716:
International Conference on Monitoring of Toxic Chemicals and Biomarkers

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