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Proceedings Paper

Detection of degraded target signatures: statistical versus neural networks
Author(s): James A. Robertson; Steven W. Worrell; Dave O'Quinn; Alain Mozart Charles
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Paper Abstract

Pattern recognition applications require algorithms be optimized to provide accurate and reproducible target identification. Approaches usually incorporate a combination preprocessing, feature extraction, and classification algorithms whose parameters have been adjusted for the best performance against a particular set of images. With the variety of neural network and statistical techniques available at each of these processing steps, choosing the correct algorithms for a particular application may be difficult. A Pattern Recognition Workstation (PRW) has been developed to assist in the selection of these algorithms. The workstation provides a variety of image degradation techniques to assist the user in assessing the performance of algorithms as a function of obscuration, noise levels, scale and rotation. Initial results are reported from preprocessors including the Contrast-Orientation-Ratio- Threshold-Maximum (CORT-X), Sobel and Laplacian, feature extractors including the Gabor Transform, Invariant Moments, and Fourier-Log-Polar Transform, and classifiers including Backpropagation and Bayes decision theory. The resulting class decision statistics are presented to assess robustness with respect to obscuration and noise levels.

Paper Details

Date Published: 16 September 1992
PDF: 13 pages
Proc. SPIE 1709, Applications of Artificial Neural Networks III, (16 September 1992); doi: 10.1117/12.139980
Show Author Affiliations
James A. Robertson, IIT Research Institute (United States)
Steven W. Worrell, IIT Research Institute (United States)
Dave O'Quinn, IIT Research Institute (United States)
Alain Mozart Charles, U.S. Army Armament Research and Development Engineering Ctr. (United States)


Published in SPIE Proceedings Vol. 1709:
Applications of Artificial Neural Networks III
Steven K. Rogers, Editor(s)

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