Share Email Print
cover

Proceedings Paper

New method of fringe pattern trace and analysis
Author(s): Guiying Wang; Aiming Sun; Jun Ren; ZhiJiang Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Centroid and geometric center methods are suggested for tracing the center location of an irregular interferogram in this paper. The methods remove limitations of general software which may only analyze straight or quasi-straight fringe patterns. The F-test method is used to control accuracy of fringe analysis. The speed and accuracy of the software depend upon the quality of the fringe pattern and a number of sample points.

Paper Details

Date Published: 24 August 1992
PDF: 9 pages
Proc. SPIE 1704, Advances in Optical Information Processing V, (24 August 1992); doi: 10.1117/12.139903
Show Author Affiliations
Guiying Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Aiming Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Jun Ren, Shanghai Institute of Optics and Fine Mechanics (China)
ZhiJiang Wang, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 1704:
Advances in Optical Information Processing V
Dennis R. Pape, Editor(s)

© SPIE. Terms of Use
Back to Top