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Proceedings Paper

Rapid surface roughness measurements of coarse objects
Author(s): John N. Pike
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Paper Abstract

A new optical method of rms surface roughness (Rq) measurement for diffusely-reflecting or scattering surfaces with Rq greater than 1 micron is disclosed, and its application to grit- blasted and plasma-sprayed surfaces described. Data acquisition by the 'multiple line shadow' (MLS) method over a small area (typically 4 mm2), image analysis, and Rq readout require at most 10 seconds, with standard deviations of 10% of mean value attainable. Measurements are made by hand-held or automated optical probe at the workpiece, with no necessity to remove the piece from its production jig. The MLS method is absolute; no calibrations are required. When automated, the MLS probe need not touch the nominally flat or large-radius workpiece surface. Minor probe and algorithm modifications allow non-contact measurement of step heights or coating thicknesses in the 1 - 30 mil range (.025 - .75 mm), also in times of 10 seconds or less at the workpiece.

Paper Details

Date Published: 15 December 1992
PDF: 11 pages
Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); doi: 10.1117/12.139243
Show Author Affiliations
John N. Pike, Materials Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 1776:
Interferometry: Surface Characterization and Testing
Katherine Creath; John E. Greivenkamp, Editor(s)

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