Share Email Print

Proceedings Paper

Device working on the light principle for surface-roughness measurement
Author(s): Josef Mandak
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The paper describes the present design of contact profile meters for evaluation of topography- roughness of machine part surfaces in the manufacturing processes, including automated ones. Considerable attention is paid to the surfaces with a difficult or no access for the contact profilometer. In order to scan these surfaces of machine parts an experimental measuring device of module conception has been designed that works on the light principle and utilizes elements of laser technique. Interesting original experimental results are given that have been obtained by both, contact and light procedure. They explain in greater detail the given problems that are attractive especially from the standpoint of perspective automated production.

Paper Details

Date Published: 15 December 1992
PDF: 7 pages
Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); doi: 10.1117/12.139239
Show Author Affiliations
Josef Mandak, Slovak Metrological Society (Czech Republic)

Published in SPIE Proceedings Vol. 1776:
Interferometry: Surface Characterization and Testing
Katherine Creath; John E. Greivenkamp, Editor(s)

© SPIE. Terms of Use
Back to Top