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Proceedings Paper

Systematic errors of a projection-moire contouring system
Author(s): Andrew H. Fagg; Bryan S. Hales; H. Philip Stahl
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Paper Abstract

Projection moire techniques are useful tools for the determination of surface contour features. They can provide interferometric type fringe patterns showing regions of equal height on the surface. The difference between moire and interferometry appears in the spacing of the equal height contours lines. In an interferometric fringe pattern, the height difference between consecutive fringes is equal to the wavelength of the illumination source and is a constant over the entire pattern. For a projection moire contour pattern the height difference between consecutive fringes is determined by illumination geometry parameters and is not constant; it changes as a function of the object's out of plane height. This variation in fringe spacing causes a misrepresentation of the surface's shape if the pattern is analyzed as a traditional interferogram. This paper discusses the types of aberrations generated by this process and the dependence of aberrations on the geometry of the object.

Paper Details

Date Published: 15 December 1992
PDF: 10 pages
Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); doi: 10.1117/12.139234
Show Author Affiliations
Andrew H. Fagg, Rose-Hulman Institute of Technology (United States)
Bryan S. Hales, Rose-Hulman Institute of Technology (United States)
H. Philip Stahl, Rose-Hulman Institute of Technology (United States)

Published in SPIE Proceedings Vol. 1776:
Interferometry: Surface Characterization and Testing
Katherine Creath; John E. Greivenkamp, Editor(s)

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