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Proceedings Paper

Ellipsometry techniques in thin-film electro-optic coefficients measurements
Author(s): Yves Levy; Pierre-Alain Chollet; Gregory Gadret; Francois Kajzar
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Paper Abstract

In this paper, a review of some different experimental methods employed for measuring the electrooptic coefficients (Pockels effect and Kerr effect) are presented, together with the most recent technique proposed by Teng and Man. For this last method, the limit of validity of a simplified method is established. A rigorous derivation is also given for studying such polymer films when the wavelength of the light beam is close to the absorption band.

Paper Details

Date Published: 25 February 1993
PDF: 12 pages
Proc. SPIE 1775, Nonlinear Optical Properties of Organic Materials V, (25 February 1993); doi: 10.1117/12.139206
Show Author Affiliations
Yves Levy, Institut d'Optique Theorique et Appliquee (France)
Pierre-Alain Chollet, Ctr. d'Etudes Nucleaires de Saclay (France)
Gregory Gadret, Ctr. d'Etudes Nucleaires de Saclay (France)
Francois Kajzar, Ctr. d'Etudes Nucleaires de Saclay (France)


Published in SPIE Proceedings Vol. 1775:
Nonlinear Optical Properties of Organic Materials V
David J. Williams, Editor(s)

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