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Proceedings Paper

Removal of chromatic aberration from projected slit target images during determination of MTF
Author(s): Roger M. Estrella; Timothy J. Sammons
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Paper Abstract

When a slit target is projected on an imaging element for determination of optical system MTF, chromatic aberration in the optoliner lens may cause the projected image pattern to broaden appreciably. This paper presents results of MTF measurements in which chromatic aberration is removed through appropriate bandpass filtering.

Paper Details

Date Published: 19 January 1993
PDF: 6 pages
Proc. SPIE 1757, Ultrahigh- and High-Speed Photography, Videography, and Photonics, (19 January 1993); doi: 10.1117/12.139153
Show Author Affiliations
Roger M. Estrella, EG&G Energy Measurements, Inc. (United States)
Timothy J. Sammons, EG&G Energy Measurements, Inc. (United States)


Published in SPIE Proceedings Vol. 1757:
Ultrahigh- and High-Speed Photography, Videography, and Photonics
Donald R. Snyder, Editor(s)

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