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Proceedings Paper

Point-source subpixel positioning from Fourier phase-shift retrieval
Author(s): Jean-Pierre Fillard; Michel Castagne; Jean-Marc Lussert
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Paper Abstract

A new method has been recently proposed which aims at measuring the relative location of point light emitters from 2D or 3D diffraction patterns; this typical inverse problem of interpretation of the scattering field can be solved with sub-pixel accuracy. It is based on the retrieval of the Fourier phase versus frequency dependence of the calculated Optical Transfer Function of the optical system. The method is favorably compared to the classical centroid method, especially in the case of locally oscillating fields. Computer implementation is proposed which allows fast sub-pixel evaluation of the z coordinates of a collection of numerous point sources. This method applies to various situations such as robotics, precision tracking, astronomy or more specifically sub-micron ranging of nanometric sized scattering particles in a microscope field. Details are given of how to obtain significant information and how to use numerical procedures in experimental frameworks. Evaluation of the accuracy of the method and algorithms is considered.

Paper Details

Date Published: 29 December 1992
PDF: 8 pages
Proc. SPIE 1767, Inverse Problems in Scattering and Imaging, (29 December 1992); doi: 10.1117/12.139039
Show Author Affiliations
Jean-Pierre Fillard, Univ. Montpellier II (France)
Michel Castagne, Univ. Montpellier II (France)
Jean-Marc Lussert, Univ. Montpellier II (France)


Published in SPIE Proceedings Vol. 1767:
Inverse Problems in Scattering and Imaging
Michael A. Fiddy, Editor(s)

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