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Proceedings Paper

Full-frame-rate PtSi IR imagery capture and characterization
Author(s): Thomas H. Altmeyer
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Paper Abstract

A system is described which is capable of capturing full-frame-rate imagery from a variety of PtSi IR systems developed at Rome Laboratory. The system is then used to validate a current model for Minimum Resolvable Temperature Difference (MRTD). Finally, possible extensions to the current MRTD model are discussed.

Paper Details

Date Published: 5 January 1993
PDF: 10 pages
Proc. SPIE 1762, Infrared Technology XVIII, (5 January 1993); doi: 10.1117/12.138974
Show Author Affiliations
Thomas H. Altmeyer, Rome Lab. (United States)

Published in SPIE Proceedings Vol. 1762:
Infrared Technology XVIII
Bjorn F. Andresen; Freeman D. Shepherd, Editor(s)

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