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Proceedings Paper

Nonuniformity corrections for a spectrally agile sensor
Author(s): William F. O'Neil
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Paper Abstract

Westinghouse is developing a detector array whose spectral characteristics can be modified dynamically. The compensation of the detectors for variations in gain, offset, and spectral characteristics provides new challenges for signal processing. In this paper, the compensation process is presented treating the detector as a 'black box'. The method includes dither scanning to provide orthogonalization of the detector with the scene being viewed, plus signal processing algorithms to establish fundamental detector parameters, and the required correction values. The paper includes the description of the detector black box characteristics, the basic application algorithm, and the correction algorithms. It is concluded that the use of a combination of factory calibrations plus dither scan compensation techniques will provide differential spectral amplitude resolution between any object and the background of better than one percent. For absolute spectral discrimination, the addition of focal plane temperature control for long term stability will provide the same capability. Spectral wavelength resolution of a few percent is projected.

Paper Details

Date Published: 5 January 1993
PDF: 13 pages
Proc. SPIE 1762, Infrared Technology XVIII, (5 January 1993); doi: 10.1117/12.138973
Show Author Affiliations
William F. O'Neil, Westinghouse Electric Corp. (United States)


Published in SPIE Proceedings Vol. 1762:
Infrared Technology XVIII
Bjorn F. Andresen; Freeman D. Shepherd, Editor(s)

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