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Proceedings Paper

Infrared analyzers for process measurements
Author(s): Timo S. Hyvarinen; Jorma Lammasniemi; Jouko Malinen; Pentti Niemela; Jussi Tenhunen
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Paper Abstract

Optical analysis techniques, infrared spectroscopy in the front end, are rapidly achieving new applications in process control. This progress is accelerated by the development of more rugged instrument constructions. This paper describes two analyzer techniques especially developed for use in demanding environments. First, the integrated multichannel detector techniques is suitable for applications where the measurement can be accomplished by using 2 to 4 wavelengths. This technique has been used to construct several compact, portable and battery-operated IR analyzers, and process analyzers which measure exactly simultaneously at each wavelength resulting in very high tolerance against rapid changes and flow of the process stream. Secondly, a miniaturized Fourier transform infrared (FTIR) spectrometer is being developed for use as an OEM module in specific process and laboratory instruments. Special attention has been paid to increase the resistance of FTIR technique to ambient vibrations. The module contains an integrated digital signal processing electronics for intelligent control of the spectrometer and for fast real time spectral data treatment. Application studies include on line measurement of the concentrations of diluted and colloidal organic detrimental substances, especially pitch components, in the circulating waters in paper machine wet end.

Paper Details

Date Published: 5 January 1993
PDF: 6 pages
Proc. SPIE 1762, Infrared Technology XVIII, (5 January 1993); doi: 10.1117/12.138960
Show Author Affiliations
Timo S. Hyvarinen, VTT Optoelectronics Lab. (Finland)
Jorma Lammasniemi, VTT Optoelectronics Lab. (Finland)
Jouko Malinen, VTT Optoelectronics Lab. (Finland)
Pentti Niemela, VTT Optoelectronics Lab. (Finland)
Jussi Tenhunen, VTT Optoelectronics Lab. (Finland)

Published in SPIE Proceedings Vol. 1762:
Infrared Technology XVIII
Bjorn F. Andresen; Freeman D. Shepherd, Editor(s)

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