Share Email Print

Proceedings Paper

TE/TM mode splitter with waveguide photodetectors
Author(s): Tami Kihara; Kiyoshi Yokomori; Shunsuke Fujita; Magane Aoki; Akihiko Hiroe
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We propose a novel TE/TM mode splitter for an integrated optical detection device for magneto-optical disk pickup. The new mode splitter is monolithically integrated on a Si substrate with pin-photodiodes. This device is composed of optical waveguides A and B with effective indices of refraction NA and NB, where NA > NB. These two waveguides are connected by a tapered transition region. The light wave guided in waveguide A is incident on the tapered transition region at an angle of incidence greater than the critical angle for the TE0 mode and smaller than the critical angle for the TM0 mode. The TE0 mode is totally reflected and the TM0 mode is totally transmitted at that region so that this device works as a TE/TM mode splitter. We fabricated the mode splitter's tapered transition region using a novel wet etching process, then examined the TE/TM mode splitting operation using a GaAlAs laser diode ((lambda) equals 0.788 micrometers ). When both TE0 and TM0 modes were exited in waveguide A, the extinction ratios of the TE0 and TM0 modes were measured with the integrated photodiodes. The extinction ratios were -25.4 dB for the TE0 mode and -23.3 dB for the TM0 mode. These values are sufficient for practical application. Furthermore, the polarization detection function was experimentally confirmed using a Faraday rotator.

Paper Details

Date Published: 13 January 1993
PDF: 6 pages
Proc. SPIE 1751, Miniature and Micro-Optics: Fabrication and System Applications II, (13 January 1993); doi: 10.1117/12.138893
Show Author Affiliations
Tami Kihara, RICOH Co., Ltd. (Japan)
Kiyoshi Yokomori, RICOH Co., Ltd. (Japan)
Shunsuke Fujita, RICOH Co., Ltd. (Japan)
Magane Aoki, RICOH Co., Ltd. (Japan)
Akihiko Hiroe, RICOH Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 1751:
Miniature and Micro-Optics: Fabrication and System Applications II
Chandrasekhar Roychoudhuri; Wilfrid B. Veldkamp, Editor(s)

© SPIE. Terms of Use
Back to Top