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Proceedings Paper

Mechanics of polarization ray tracing
Author(s): Russell A. Chipman
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Paper Abstract

Polarization ray tracing, which consist of several extensions to geometrical ray tracing, calculates the evolution of polarization states along ray paths and determines the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and a three-dimensional polarization ray tracing calculi, examining the issues of local versus global coordinates, amplitude versus phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.

Paper Details

Date Published: 11 December 1992
PDF: 14 pages
Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); doi: 10.1117/12.138816
Show Author Affiliations
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 1746:
Polarization Analysis and Measurement
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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