Share Email Print
cover

Proceedings Paper

Polarized light-scattering applications and measurements of fundamentalsystems
Author(s): William S. Bickel; Gorden W. Videen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We discuss scattering in the context of the Stokes vectors and Mueller matrices that completely characterize the polarization state of the scattered light. A polar nephelometer is used to measure the light scattering Mueller matrix elements of various ideal systems. These systems are fundamental and solvable theoretically. The scattering systems can be perturbed and the amount of perturbation can be quantified. The light-scattering signals can then be examined as a function of the amount of perturbation. Eventually, the perturbation dominates the system so that the addition of more of the perturbation does not significantly alter the appearance of the scattering system or of the polarized light scattering signals. These saturated systems may also be thought of as fundamental systems. In this paper we examine some fundamental systems and discuss models which predict the polarization state of some highly perturbed scattering systems.

Paper Details

Date Published: 11 December 1992
PDF: 8 pages
Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); doi: 10.1117/12.138784
Show Author Affiliations
William S. Bickel, Univ. of Arizona (United States)
Gorden W. Videen, Dalhousie Univ. (Canada)


Published in SPIE Proceedings Vol. 1746:
Polarization Analysis and Measurement
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

© SPIE. Terms of Use
Back to Top