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Proceedings Paper

Polarization sensitivity analysis of an earth remote-sensing instrument: the MODIS-N Phase B study
Author(s): Eugene Waluschka; Peter R. Silverglate; Christ Ftaclas; Aaron N. Turner
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Paper Abstract

Polarization analysis software that employs Jones matrix formalism to calculate the polarization sensitivity of an instrument design was developed at Hughes Danbury Optical Systems. The code is capable of analyzing the full ray bundle at its angles of incidence for each optical surface. Input is based on the system ray trace and the thin film coating design at each surface. The MODIS-N (Moderate Resolution Imaging Spectrometer) system is used to demonstrate that it is possible to meet stringent requirements on polarization insensitivity associated with planned remote sensing instruments. Analysis indicates that a polarization sensitivity less than or equal to 2 percent was achieved in all desired spectral bands at all pointing angles, per specification. Polarization sensitivities were as high as 10 percent in similar remote sensing instruments.

Paper Details

Date Published: 11 December 1992
PDF: 8 pages
Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); doi: 10.1117/12.138777
Show Author Affiliations
Eugene Waluschka, Hughes Danbury Optical Systems, Inc. (United States)
Peter R. Silverglate, Hughes Danbury Optical Systems, Inc. (United States)
Christ Ftaclas, Hughes Danbury Optical Systems, Inc. (United States)
Aaron N. Turner, Hughes Danbury Optical Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 1746:
Polarization Analysis and Measurement
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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