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Proceedings Paper

Soft x-ray microscopy with a 182-angstrom soft x-ray laser
Author(s): Darrell S. DiCicco; Dong-Su Kim; Leonid Polonskiy; Charles H. Skinner; Szymon Suckewer
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Paper Abstract

The high brightness and short pulse duration of soft x-ray lasers provide unique advantages for x-ray microscopy. We briefly review soft x-ray laser development at Princeton University and present results from the development of novel soft x-ray microscopes. The Princeton soft x- ray laser at 18.2 nm has been used to record high resolution contact images of biological specimens. More recently we have demonstrated proof-of-principle of reflection imaging in the soft x-ray wavelength range with the first results from a soft x-ray reflection imaging microscope. The microscope used a Schwarzschild objective with Mo/Si multilayer mirrors (normal incidence reflectivity of approximately 20% per surface) to form an image in reflected 18.2 nm soft x rays. In a separate experiment a novel `diffraction plate,' designed as an alternative to conventional condenser optics, has been tested.

Paper Details

Date Published: 13 January 1993
PDF: 10 pages
Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138757
Show Author Affiliations
Darrell S. DiCicco, Princeton Univ. (United States)
Dong-Su Kim, Princeton Univ. (United States)
Leonid Polonskiy, Princeton Univ. (United States)
Charles H. Skinner, Princeton Univ. (United States)
Szymon Suckewer, Princeton Univ. (United States)

Published in SPIE Proceedings Vol. 1741:
Soft X-Ray Microscopy
Chris J. Jacobsen; James E. Trebes, Editor(s)

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