Share Email Print
cover

Proceedings Paper

Imaging microscopy with x-ray lasers at LLNL
Author(s): Luiz Barroca Da Silva; James E. Trebes; Stanley Mrowka; Brian J. MacGowan; Jeffrey A. Koch; Dennis L. Matthews; Troy W. Barbee; Rod Balhorn; Joe W. Gray; Erik H. Anderson; D. Kern; David T. Attwood
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Imaging microscopy with short pulse (200 ps) x-ray lasers offers the opportunity of high resolution three-dimensional imaging of specimens in an aqueous environment without the blurring effects associated with natural motion. As a first step toward this goal we have performed imaging experiments which clearly resolved 500 angstrom features on a gold test pattern. In addition, we have taken images of dried biological specimens as a basis for comparison in future wet specimen imaging. The results of these experiments are described. We also discuss some of the alignment problems involved in doing x-ray microscopy with low repetition rate systems where in situ focusing of the imaging optics is not practical as single shot exposures can alter the specimen.

Paper Details

Date Published: 13 January 1993
PDF: 6 pages
Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138756
Show Author Affiliations
Luiz Barroca Da Silva, Lawrence Livermore National Lab. (United States)
James E. Trebes, Lawrence Livermore National Lab. (United States)
Stanley Mrowka, Lawrence Livermore National Lab. (United States)
Brian J. MacGowan, Lawrence Livermore National Lab. (United States)
Jeffrey A. Koch, Lawrence Livermore National Lab. (United States)
Dennis L. Matthews, Lawrence Livermore National Lab. (United States)
Troy W. Barbee, Lawrence Livermore National Lab. (United States)
Rod Balhorn, Lawrence Livermore National Lab. (United States)
Joe W. Gray, Lawrence Livermore National Lab. (United States)
Erik H. Anderson, Lawrence Berkeley Lab. (United States)
D. Kern, Lawrence Berkeley Lab. (United States)
David T. Attwood, Lawrence Berkeley Lab. (United States)


Published in SPIE Proceedings Vol. 1741:
Soft X-Ray Microscopy
Chris J. Jacobsen; James E. Trebes, Editor(s)

© SPIE. Terms of Use
Back to Top