Share Email Print
cover

Proceedings Paper

New results from MAXIMUM: an x-ray scanning photoemission microscope
Author(s): W. Ng; Avijit K. Ray-Chaudhuri; S. H. Liang; John T. Welnak; John P. Wallace; S. Singh; Cristiano Capasso; Franco Cerrina; Giorgio Margaritondo; James H. Underwood; Jeffrey B. Kortright; Rupert C. C. Perera
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The scanning soft x-ray photoemission microscope (MAXIMUM) operating at the Synchrotron Radiation Center at the University of Wisconsin-Madison has been substantially upgraded. The major upgrades are: installation of a new beam line that is optimized for the microscope; new optical mount and alignment system for the Schwarzschild objective; a new scanning stage; installation of a cylindrical mirror analyzer; implementation of an ultrahigh vacuum sample preparation chamber and transfer system; a new window-driven data acquisition program that is more flexible and user-friendly. The new system had demonstrated better than 0.1 micrometers spatial resolution, and photoemission data with 350 meV energy resolution has been obtained.

Paper Details

Date Published: 13 January 1993
PDF: 10 pages
Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138744
Show Author Affiliations
W. Ng, Univ. of Wisconsin/Madison (United States)
Avijit K. Ray-Chaudhuri, Univ. of Wisconsin/Madison (United States)
S. H. Liang, Univ. of Wisconsin/Madison (United States)
John T. Welnak, Univ. of Wisconsin/Madison (United States)
John P. Wallace, Univ. of Wisconsin/Madison (United States)
S. Singh, Univ. of Wisconsin/Madison (United States)
Cristiano Capasso, Univ. of Wisconsin/Madison (United States)
Franco Cerrina, Univ. of Wisconsin/Madison (United States)
Giorgio Margaritondo, Vanderbilt Univ. (France)
James H. Underwood, Lawrence Berkeley Lab. (United States)
Jeffrey B. Kortright, Lawrence Berkeley Lab. (United States)
Rupert C. C. Perera, Lawrence Berkeley Lab. (United States)


Published in SPIE Proceedings Vol. 1741:
Soft X-Ray Microscopy
Chris J. Jacobsen; James E. Trebes, Editor(s)

© SPIE. Terms of Use
Back to Top