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Proceedings Paper

Hard x-ray microimaging techniques based on phase zone plates
Author(s): Barry P. Lai; Wenbing Yun; Dan G. Legnini; Y. H. Xiao; John J. Chrzas
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Paper Abstract

Phase zone plates of high focusing efficiency and submicron resolution have been demonstrated in the hard x-ray region. A scanning microscope based on these focusing optics will create many new applications. Preliminary results in the applications of the microscope are reported here. In the area of imaging, we have utilized absorption contrast to clearly identify the locations of Au and Ni constituents in a sample of two interleaved grids. Micro- EXAFS spectra has also been obtained on a Ni foil. Fluorescence from a nuclear fuel sample, as an example of microanalysis, has revealed the elemental distribution at the interfaces. Lastly, microdiffraction from AgBr crystallites has been studied.

Paper Details

Date Published: 13 January 1993
PDF: 6 pages
Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138729
Show Author Affiliations
Barry P. Lai, Argonne National Lab. (United States)
Wenbing Yun, Argonne National Lab. (United States)
Dan G. Legnini, Argonne National Lab. (United States)
Y. H. Xiao, Argonne National Lab. (United States)
John J. Chrzas, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 1741:
Soft X-Ray Microscopy
Chris J. Jacobsen; James E. Trebes, Editor(s)

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