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Proceedings Paper

Nuclear monochromator by grazing incidence antireflection films of 119SnO2
Author(s): Hitoshi Homma; Meiman Kentjana; Ercan E. Alp; Timothy M. Mooney; Thomas S. Toellner; E. Witthoff
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Paper Abstract

A nuclear monochromator using grazing incidence anti-reflection (GIAR) films of 119SnO2 coated on a Pd backing mirror was designed, fabricated and characterized. 119SnO2/Pd/quartz GIAR films were synthesized by a magnetron reactive sputtering technique. The films were characterized by x-ray scattering of 23.87 keV synchrotron radiation source. From the measurement of off-resonance reflectivity and the simulation of the resonant nuclear reflectivity, approximately 0.8 reflectivity with 10-2 electronic reflectivity and an energy band width approximately 100 (Gamma) where (Gamma) is a natural line width, at a 2 mrad incident beam angle would be expected. The requirements and alternative methods to improve performance of a GIAR film nuclear monochromator were discussed.

Paper Details

Date Published: 20 January 1993
PDF: 10 pages
Proc. SPIE 1740, Optics for High-Brightness Synchrotron Radiation Beamlines, (20 January 1993); doi: 10.1117/12.138704
Show Author Affiliations
Hitoshi Homma, CUNY/Brooklyn College (United States)
Meiman Kentjana, CUNY/Brooklyn College (United States)
Ercan E. Alp, Argonne National Lab. (United States)
Timothy M. Mooney, Argonne National Lab. (United States)
Thomas S. Toellner, Argonne National Lab. (United States)
E. Witthoff, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 1740:
Optics for High-Brightness Synchrotron Radiation Beamlines
John R. Arthur, Editor(s)

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