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Proceedings Paper

Soft to firm x-ray spectroscopy at a hard x-ray facility: polarization-sensitive experiments
Author(s): Jose Goulon; H. Emerich; Carlos M. Giles; Cecile Malgrange; Nicholas B. Brookes; Francesco Sette; L. Braicovich
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Paper Abstract

The ESRF beamline #6 is dedicated to polarization dependent spectroscopies at excitation energies ranging from 0.4 up to 20 keV. This broad energy range will be covered with two helical undulators (Helios-I and Helios II) providing the user with a full control of the photon polarization. Two kinds of optics will be made available: (1) low energy experiments (0.4 keV <EQ E <EQ 2.0 keV) will be carried out on a side-branch beamline equipped with a 'Dragon-type' grating spectrometer; (2) single crystal Bragg optics will be used above 2 keV on the straight branch part of the beamline. We report on the present status and optical arrangement of both branches. Special emphasis is put onto the polarization transfer in Bragg optics with elliptically or circularly polarized light. Various experimental configurations have been evaluated with respect to the figure of merit I.(tau) 2, where I is the transmitted intensity and (tau) is the circular polarization rate. Operation of the beamline will start with a simplified, conservative optical configuration, while more challenging options require specific technical developments.

Paper Details

Date Published: 20 January 1993
PDF: 12 pages
Proc. SPIE 1740, Optics for High-Brightness Synchrotron Radiation Beamlines, (20 January 1993); doi: 10.1117/12.138696
Show Author Affiliations
Jose Goulon, European Synchrotron Radiation Facility (France)
H. Emerich, European Synchrotron Radiation Facility (France)
Carlos M. Giles, European Synchrotron Radiation Facility (France)
Cecile Malgrange, European Synchrotron Radiation Facility and Univ. de Paris VI and (France)
Nicholas B. Brookes, European Synchrotron Radiation Facility (France)
Francesco Sette, European Synchrotron Radiation Facility (France)
L. Braicovich, European Synchrotron Radiation Facility and Politecnico di Milano (France)

Published in SPIE Proceedings Vol. 1740:
Optics for High-Brightness Synchrotron Radiation Beamlines
John R. Arthur, Editor(s)

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