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Proceedings Paper

Characterization of an accelerator neutron source based on the Be(d,n) reaction
Author(s): James W. Meadows; Donald L. Smith
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Paper Abstract

Small accelerator neutron sources offer considerable potential for applied neutron radiography applications. Among the desirable features are relatively low costs, limited operating hazards, opportunities for tailoring primary neutron spectra, compactness and portability, and modest licensing requirements (compared to fission reactors). However, exploitation of this potential has been somewhat limited, in part, by incomplete knowledge of the primary-neutron yields and energy spectra from the favorable source reactions. This work describes an extensive experimental determination of zero-degree neutron yields and energy spectra from the 9Be(d,n)10B source reaction, for incident deuterons of 2.6 to 7.0 MeV on a thick beryllium metal target. This information was acquired by means of time-of-flight measurements that were conducted with a calibrated uranium fission detector. Tables and plots of neutron-producing reaction data are presented. This information provides input which will be essential for applications involving the primary spectrum as well as for the design of neutron moderators and for calculation of thermal-neutron yield factors. Such analyses will be prerequisites in assessing the suitability of this source for various possible neutron radiography applications and, also, for assisting in the design of appropriate detectors to be used in neutron imaging devices.

Paper Details

Date Published: 2 February 1993
PDF: 12 pages
Proc. SPIE 1737, Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications, (2 February 1993); doi: 10.1117/12.138675
Show Author Affiliations
James W. Meadows, Argonne National Lab. (United States)
Donald L. Smith, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 1737:
Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications
John M. Carpenter; David B. Cline; Richard C. Lanza; David F. R. Mildner, Editor(s)

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