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Proceedings Paper

Neutron-damaged GaAs detectors for use in a Compton spectrometer
Author(s): Judith E. Kammeraad; Kenneth E. Sale; Ching Lin Wang; Rose Mary Baltrusaitis
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Paper Abstract

Detectors made of GaAs are being studied for use on the focal plane of a Compton spectrometer which measures 1 MeV to 25 MeV gamma rays with high energy resolution (1% or 100 keV, whichever is greater) and 200 ps time resolution. The detectors are GaAs chips (Cr-doped or un-doped) that have been neutron-damaged to improve the time response. The detectors are used to measure fast transient signals in the current mode. The properties of various GaAs detector configurations are being studied by bombarding sample detectors with short pulses of 4 MeV to 16 MeV electrons at the Linac Facility at EG&G Energy Measurements, Inc., Santa Barbara, California Operations. Measurements of detector sensitivity and impulse response versus detector bias, thickness, and electron beam energy and intensity have been performed and are presented.

Paper Details

Date Published: 22 December 1992
PDF: 7 pages
Proc. SPIE 1734, Gamma-Ray Detectors, (22 December 1992); doi: 10.1117/12.138595
Show Author Affiliations
Judith E. Kammeraad, Lawrence Livermore National Lab. (United States)
Kenneth E. Sale, Lawrence Livermore National Lab. (United States)
Ching Lin Wang, Lawrence Livermore National Lab. (United States)
Rose Mary Baltrusaitis, EG&G Energy Measurements, Inc. (United States)


Published in SPIE Proceedings Vol. 1734:
Gamma-Ray Detectors
Elena Aprile, Editor(s)

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