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Proceedings Paper

Optically implemented residue-number-system processing for large-order systems
Author(s): Dickron Mergerian; Edward C. Malarkey; Joe C. Bradley; Hyo-Kun Hahn; Paul R. Beaudet; Gary E. Marx; J. Gonella; J. L. Gleich; James L. Davis
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Paper Abstract

Two techniques developed during recent years have significantly enhanced the capabilities of residue-number-system (RNS) based processors to meet the demanding requirements of large- order systems. First, a method of factoring the prime modular subprocessor allows a major reduction in the componentry required to implement a look-up-table (LUT) based processor. Secondly, the use of CORE functions permits a drastic reduction in the number and magnitude of prime moduli required when the processor is applied in the solution of problems with many degrees of freedom. This paper will discuss the use of RNS-based processors in the solution of adaptive antenna problems, the basic drawbacks and the manner in which factored LUTs and CORE functions circumvent these drawbacks.

Paper Details

Date Published: 2 December 1992
PDF: 7 pages
Proc. SPIE 1703, Optical Technology for Microwave Applications VI and Optoelectronic Signal Processing for Phased-Array Antennas III, (2 December 1992); doi: 10.1117/12.138411
Show Author Affiliations
Dickron Mergerian, Westinghouse Advanced Technology Div. (United States)
Edward C. Malarkey, Westinghouse Advanced Technology Div. (United States)
Joe C. Bradley, Westinghouse Advanced Technology Div. (United States)
Hyo-Kun Hahn, Westinghouse Advanced Technology Div. (United States)
Paul R. Beaudet, Westinghouse Advanced Technology Div. (United States)
Gary E. Marx, Westinghouse Advanced Technology Div. (United States)
J. Gonella, Syracuse Research Corp. (United States)
J. L. Gleich, Syracuse Research Corp. (United States)
James L. Davis, Rome Lab. (United States)


Published in SPIE Proceedings Vol. 1703:
Optical Technology for Microwave Applications VI and Optoelectronic Signal Processing for Phased-Array Antennas III
Shi-Kay Yao; Brian M. Hendrickson, Editor(s)

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