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Proceedings Paper

Optical method for detection of microwave-field-caused breakdown in semiconductors
Author(s): M. I. Akimov; A. V. Kozar
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Paper Details

Date Published: 2 December 1992
PDF: 7 pages
Proc. SPIE 1703, Optical Technology for Microwave Applications VI and Optoelectronic Signal Processing for Phased-Array Antennas III, (2 December 1992); doi: 10.1117/12.138386
Show Author Affiliations
M. I. Akimov, Moscow State Univ. (Russia)
A. V. Kozar, Moscow State Univ. (Russia)


Published in SPIE Proceedings Vol. 1703:
Optical Technology for Microwave Applications VI and Optoelectronic Signal Processing for Phased-Array Antennas III
Shi-Kay Yao; Brian M. Hendrickson, Editor(s)

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