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Proceedings Paper

Modeling the effects of IR subpixel nonuniformities on sensor performance
Author(s): James P. Karins
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Paper Abstract

A critical component of IR sensors is the infrared detector. In order to predict sensor performance, a step-function optical response is typically assumed. This model is then used to predict overall sensor performance and to optimize signal processing algorithms. However, pixels rarely exhibit this ideal behavior. Two deviations in ideal response are described: a pixel center region degradation and an exponentially decaying region on the outside of the pixel corresponding to carrier diffusion. The corresponding MTFs are calculated and the effect on matched filters and sensor performance is modeled.

Paper Details

Date Published: 28 August 1992
PDF: 5 pages
Proc. SPIE 1693, Surveillance Technologies II, (28 August 1992); doi: 10.1117/12.138098
Show Author Affiliations
James P. Karins, Mission Research Corp. (United States)

Published in SPIE Proceedings Vol. 1693:
Surveillance Technologies II
Sankaran Gowrinathan; James F. Shanley, Editor(s)

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