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Proceedings Paper

Excite-probe two-color Z-scan
Author(s): Jiang-Wei Wang; Mansoor Sheik-Bahae; Ali A. Said; David J. Hagan; Eric W. Van Stryland
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Paper Abstract

Using an excite-i,robe two-co1or Zscan technique, we investigate the dynamics of optical nonlinearites in semiconductors with picosecond pulses at 1.06 and 0.532 pm. We use the technique to obtain a direct timeresolved measurement of the nondegenerate nonlinear refraction in polycrystalline ZnSe and show how it can resolve the bound electronic and free carrier components.

Paper Details

Date Published: 18 August 1992
PDF: 4 pages
Proc. SPIE 1692, Nonlinear and Electro-Optic Materials for Optical Switching, (18 August 1992); doi: 10.1117/12.138069
Show Author Affiliations
Jiang-Wei Wang, CREOL/Univ. of Central Florida (United States)
Mansoor Sheik-Bahae, CREOL/Univ. of Central Florida (United States)
Ali A. Said, CREOL/Univ. of Central Florida (United States)
David J. Hagan, CREOL/Univ. of Central Florida (United States)
Eric W. Van Stryland, CREOL/Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 1692:
Nonlinear and Electro-Optic Materials for Optical Switching
M. J. Soileau, Editor(s)

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