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Proceedings Paper

Performance and application of serial-scan FLIRs
Author(s): James L. Gates; Steven E. Krug; William H. Wan
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Paper Details

Date Published: 16 September 1992
PDF: 8 pages
Proc. SPIE 1689, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing III, (16 September 1992); doi: 10.1117/12.137979
Show Author Affiliations
James L. Gates, FLIR Systems, Inc. (United States)
Steven E. Krug, FLIR Systems, Inc. (United States)
William H. Wan, FLIR Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 1689:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing III
Gerald C. Holst, Editor(s)

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