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Proceedings Paper

LEO thermal imagers: push broom or whisk broom?
Author(s): Pierre J. Turon; Thibault S. Depost
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Paper Abstract

LEO Thermal imaging is controlled by two parameters: to time need to scan the foot print along the track and ti integration time in thermal band. It is known that whisk broom is adequate when to > > ti (low resolution) and push broom is of interest when to is congruent to ti (high resolution). However moderate size projects are limited to low or intermediate resolution (for 30 m, to is about two orders of magnitude greater than ti) and push broom is not mandatory. The need for high frequency calibration to eliminate 1/f detector noise (especially for (lambda) > 11 micrometers ) makes push broom advantage smaller than expected. Microscanning can be thought of as a way to match to and ti as well as a convenient calibration mechanism. A configuration mixing microscanning and push broom design is shown to be a very efficient compromise. Problems like detector butting, fast calibration, long life time mechanism, and signal processing at chip level are more easily solved within the proposed concept.

Paper Details

Date Published: 16 September 1992
PDF: 10 pages
Proc. SPIE 1689, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing III, (16 September 1992); doi: 10.1117/12.137969
Show Author Affiliations
Pierre J. Turon, SODERN (France)
Thibault S. Depost, SODERN (France)

Published in SPIE Proceedings Vol. 1689:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing III
Gerald C. Holst, Editor(s)

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