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Proceedings Paper

AEDC's transportable direct-write scene generation test capability
Author(s): Heard S. Lowry; Parker David Elrod; T. Chris Layne
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Paper Abstract

A Transportable Direct Write Scene Generation (TDWSG) test capability has been developed at the Arnold Engineering Development Center (AEDC) for visible and IR focal plane array (FPA) testing which utilizes laser sources and two-axis acousto-optic deflectors. The objective of this effort is to provide a test and evaluation facility which will help reduce space sensor development risks by testing FPAs with their data subsystems against realistic mission scenarios in a space environment. The TDWSG's performance envelope covers both high- speed (100 microsecond(s) frame time) scanning and slower staring formats. A modular concept is used to address large (512 X 512 pixel) FPAs. Scene inputs can be derived from various sources including the Strategic Scene Generation Model (SSGM). A continuance of this effort is being applied toward development of a fixed-site Scene Generation Test Capability (SGTC).

Paper Details

Date Published: 21 September 1992
PDF: 12 pages
Proc. SPIE 1687, Characterization, Propagation, and Simulation of Sources and Backgrounds II, (21 September 1992); doi: 10.1117/12.137821
Show Author Affiliations
Heard S. Lowry, Calspan Corp. (United States)
Parker David Elrod, Calspan Corp. (United States)
T. Chris Layne, Calspan Corp. (United States)


Published in SPIE Proceedings Vol. 1687:
Characterization, Propagation, and Simulation of Sources and Backgrounds II
Dieter Clement; Wendell R. Watkins, Editor(s)

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