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Proceedings Paper

Study of the recombination mechanisms and carrier lifetimes in Hg0.8Cd0.2Te alloy
Author(s): Jingxuan Yan; Xierong Hu; Jiaxiong Fang; Guosen Xu
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Paper Details

Date Published: 1 September 1992
PDF: 9 pages
Proc. SPIE 1685, Infrared Detectors and Focal Plane Arrays II, (1 September 1992); doi: 10.1117/12.137806
Show Author Affiliations
Jingxuan Yan, Qingdao Univ. (China)
Xierong Hu, Shandong Univ. (China)
Jiaxiong Fang, Shanghai Institute of Technical Physics (China)
Guosen Xu, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 1685:
Infrared Detectors and Focal Plane Arrays II
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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