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Proceedings Paper

Element of a new infrared detector-plasma edge detector
Author(s): Dingrong Qian
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Paper Abstract

Plasma reflectivity edge in infrared reflectivity spectra measured on narrow-gap semiconductors has been found to be most sensitive to the variation of carrier concentration based upon which a new way of infrared modulation has been studied. The modulation gain in power is impressively high. Thus a less sensitive room-temperature infrared detector could be as sensitive as the existing cooled infrared detectors in detecting middle-infrared radiation. The detectivity has been calculated.

Paper Details

Date Published: 1 September 1992
PDF: 8 pages
Proc. SPIE 1685, Infrared Detectors and Focal Plane Arrays II, (1 September 1992); doi: 10.1117/12.137802
Show Author Affiliations
Dingrong Qian, Lab. for Infrared Physics (China)


Published in SPIE Proceedings Vol. 1685:
Infrared Detectors and Focal Plane Arrays II
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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