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Proceedings Paper

Optimum barrier height in Schottky-barrier infrared CCD image sensor
Author(s): Akihito Tanabe; Nobukazu Teranishi; Shigeru Tohyama; Kazuo Konuma; Kouichi Masubuchi
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Paper Abstract

Noise equivalent temperature difference (NE(Delta) T) values in a PtSi Schottky-barrier (SB) infrared CCD image sensor are calculated with variations in spectral response, device operating temperature, and internal radiation intensity generated from a lens barrel, using measured values from a recently developed 648 X 487 pixel SB infrared CCD image sensor. The barrier height is allowed to vary, whereas it was fixed before. NE(Delta) T values were calculated as a function of barrier height and were found to have a minimum. The optimum barrier height depends on quantum efficiency coefficient, device operating temperature, and internal radiation intensity.

Paper Details

Date Published: 1 September 1992
PDF: 7 pages
Proc. SPIE 1685, Infrared Detectors and Focal Plane Arrays II, (1 September 1992); doi: 10.1117/12.137794
Show Author Affiliations
Akihito Tanabe, NEC Corp. (Japan)
Nobukazu Teranishi, NEC Corp. (Japan)
Shigeru Tohyama, NEC Corp. (Japan)
Kazuo Konuma, NEC Corp. (Japan)
Kouichi Masubuchi, NEC Corp. (Japan)


Published in SPIE Proceedings Vol. 1685:
Infrared Detectors and Focal Plane Arrays II
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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