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Proceedings Paper

Miniature closed-cycle cooler for FPA detectors
Author(s): Nachman Pundak; Gregory R. Leonard; J. Brian Toft; Jan Tollefson
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Paper Abstract

The various types of the Focal Plane Array JR detectors presently in development or under production are characterized by their relatively large size compared with the traditional discrete element detectors. Most of these FPAs contain "on-board" signal processors allowing the number of electrical leads to the cooled detectors plane to be independent of the number of pixels in the array. In general, the total heat load of such detectors is 1.5 -2.0 times larger than an equivalent discrete element type detector assembly. On the other hand, the size of these FPA's dictates the thermal mass of the detector array itself, and in particular when the whole detector/cooled radiation shield/cold optics is considered to be of an order of magnitude larger than an equivalent discrete elements detector assembly. This fact causes the cooldown time requirement to be the lead factor when cooling power is considered, rather than the steady state heat load. In order to achieve miniaturization, low input power and fast cooldown time, a combined team of Cincinnati Electronics, Mason, Ohio and RICOR Ltd., En Harod, Israel are working on the development phase of an integral cooler/dewar assembly - IDCA, specially tailored for FPA type detectors. The design concepts, technical parameters and some experimental test results are presented.

Paper Details

Date Published: 12 August 1992
PDF: 5 pages
Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992); doi: 10.1117/12.137783
Show Author Affiliations
Nachman Pundak, Ricor Ltd. (Israel)
Gregory R. Leonard, Cincinnati Electronics Corp. (United States)
J. Brian Toft, Cincinnati Electronics Corp. (United States)
Jan Tollefson, Cincinnati Electronics Corp. (United States)


Published in SPIE Proceedings Vol. 1683:
Infrared Focal Plane Array Producibility and Related Materials
Raymond S. Balcerak; Paul W. Pellegrini; Dean A. Scribner, Editor(s)

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