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Proceedings Paper

In-situ monitoring for HgCdTe device fabrication
Author(s): Patricia B. Smith; Glennis J. Orloff; Roger L. Strong
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Paper Details

Date Published: 12 August 1992
PDF: 9 pages
Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992); doi: 10.1117/12.137778
Show Author Affiliations
Patricia B. Smith, Texas Instruments Inc. (United States)
Glennis J. Orloff, Texas Instruments Inc. (United States)
Roger L. Strong, Texas Instruments Inc. (United States)

Published in SPIE Proceedings Vol. 1683:
Infrared Focal Plane Array Producibility and Related Materials
Raymond S. Balcerak; Paul W. Pellegrini; Dean A. Scribner, Editor(s)

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