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Proceedings Paper

MMST development for HgCdTe FPA manufacture
Author(s): J. D. Luttmer
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Paper Abstract

The Microelectronics Manufacturing Science and Technology (MMST) program at Texas Instruments is developing a generic semiconductor device manufacturing technology for the mid-1990s. In-situ vacuum processing, modular cluster tool equipment, sensor-based real time process control and computer integrated manufacturing are key components of this activity. Although the program goal is to develop and demonstrate low volume, fast cycle time, cost effective silicon microelectronic manufacturing, the technology also is applicable to HgCdTe, GaAs and other materials. The extension and evolution of MMST concepts and technologies to HgCdTe focal plane array production at TI are discussed. The use of generic process modules, sensors, and energy sources are outlined and compared for silicon integrated circuit and HgCdTe FPA applications. Generic modules and those tailored to specific HgCdTe process requirements are discussed.

Paper Details

Date Published: 12 August 1992
PDF: 9 pages
Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992); doi: 10.1117/12.137774
Show Author Affiliations
J. D. Luttmer, Texas Instruments Inc. (United States)

Published in SPIE Proceedings Vol. 1683:
Infrared Focal Plane Array Producibility and Related Materials
Raymond S. Balcerak; Paul W. Pellegrini; Dean A. Scribner, Editor(s)

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