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Proceedings Paper

Use of narrowband laser speckle for MTF characterization of CCDs
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Paper Abstract

This paper presents a method for measuring the modulation transfer function (MTF) of a detector array from zero frequency to twice the Nyquist frequency. The equipment is simple and requires no complex optical components. Also, the use of laser speckle circumvents the problems inherent with traditional methods of MTF testing where the phase of the test target with respect to the sampling grid affects the observed contrast. The MTF measured with this method is compared to the MTF measured using sine targets. The results of the two methods agree to within 2%.

Paper Details

Date Published: 12 August 1992
PDF: 8 pages
Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992); doi: 10.1117/12.137767
Show Author Affiliations
Martin Sensiper, CREOL/Univ. of Central Florida (United States)
Glenn D. Boreman, CREOL/Univ. of Central Florida (United States)
Alfred Dale Ducharme, CREOL/Univ. of Central Florida (United States)
Donald R. Snyder, U.S. Air Force Wright Lab. (United States)


Published in SPIE Proceedings Vol. 1683:
Infrared Focal Plane Array Producibility and Related Materials
Raymond S. Balcerak; Paul W. Pellegrini; Dean A. Scribner, Editor(s)

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