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Proceedings Paper

Automatic test comes to focal plane array production
Author(s): Frank L. Skaggs; T. D. Barton
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Paper Abstract

To meet the needs of military and commercial markets, the infrared focal plane array industry must develop new, effective and low cost methods of fabricating and testing imaging detectors. This paper describes Texas Instruments new concepts in automated testing and cold probe technology as they apply to volume production.

Paper Details

Date Published: 12 August 1992
PDF: 8 pages
Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992); doi: 10.1117/12.137766
Show Author Affiliations
Frank L. Skaggs, Texas Instruments Inc. (United States)
T. D. Barton, Texas Instruments Inc. (United States)


Published in SPIE Proceedings Vol. 1683:
Infrared Focal Plane Array Producibility and Related Materials
Raymond S. Balcerak; Paul W. Pellegrini; Dean A. Scribner, Editor(s)

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