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Proceedings Paper

Industrial process control with array spectroscopy
Author(s): Douglas S. Malchow
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Paper Abstract

A survey of the industrial process control applications using array spectrometers. Includes discussion of desirable features of an industrial spectrometer system.

Paper Details

Date Published: 14 August 1992
PDF: 4 pages
Proc. SPIE 1681, Optically Based Methods for Process Analysis, (14 August 1992); doi: 10.1117/12.137737
Show Author Affiliations
Douglas S. Malchow, EG&G Princeton Applied Research (United States)


Published in SPIE Proceedings Vol. 1681:
Optically Based Methods for Process Analysis
David S. Bomse; Harry Brittain; Stuart Farquharson; Jeremy M. Lerner; Alan J. Rein; Cary Sohl; Terry R. Todd; Lois Weyer, Editor(s)

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