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Proceedings Paper

Remote Raman analysis for process-monitoring applications
Author(s): Francis J. Purcell; Roy E. Grayzel; Fran Adar
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Paper Abstract

Recent developments in Raman instrumentation have produced sensitive compact rugged systems capable of monitoring industrial processes in-situ using fiber optic probes. Raman spectroscopy's ability to give definitive molecular information in aqueous and organic matrices makes it exceedingly powerful in monitoring and troubleshooting chemical processing.

Paper Details

Date Published: 14 August 1992
PDF: 10 pages
Proc. SPIE 1681, Optically Based Methods for Process Analysis, (14 August 1992); doi: 10.1117/12.137731
Show Author Affiliations
Francis J. Purcell, Spex Industries, Inc. (United States)
Roy E. Grayzel, Spex Industries, Inc. (United States)
Fran Adar, Spex Industries, Inc. (United States)


Published in SPIE Proceedings Vol. 1681:
Optically Based Methods for Process Analysis
David S. Bomse; Harry Brittain; Stuart Farquharson; Jeremy M. Lerner; Alan J. Rein; Cary Sohl; Terry R. Todd; Lois Weyer, Editor(s)

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